发明名称 Free-form optical surface measuring apparatus and method
摘要 <p>Measuring apparatus for measuring a position of a device (2) that is rotatable relative to a movable stage (3), comprising: a measurement frame (4) and a contactless distance measurement device (5) for measuring in said first direction a distance between said measurement frame and a predetermined measurement surface (7) provided on said stage. According to the invention, said predetermined measurement surface is formed by a surface of said rotatable device. The method comprises providing a predetermined measurement surface on a rotatable device; and measuring directly on said rotatable device a first distance between a measurement frame and said predetermined measurement surface. In this way, aspheric or free-form surfaces of optical elements can be measured easily in closed loop without introducing abbe-errors. <IMAGE></p>
申请公布号 EP1519144(A1) 申请公布日期 2005.03.30
申请号 EP20030078094 申请日期 2003.09.29
申请人 NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO 发明人 HENSELMANS, RENS;ROSIELLE, PETRUS CAROLUS JOHANNES NICOLAAS
分类号 G01B9/02;G01B21/04;G01B21/20;(IPC1-7):G01B21/04;G01M11/02 主分类号 G01B9/02
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