发明名称 FORMATION METHOD OF CRYSTALLINE SEMICONDUCTOR FILM, FORMATION METHOD OF THIN-FILM TRANSISTOR WITH THE CRYSTALLINE SEMICONDUCTOR FILM AND FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH THE CRYSTALLINE SEMICONDUCTOR FILM
摘要 PROBLEM TO BE SOLVED: To provide a new formation method of a crystalline semiconductor film which performs positional control of crystal grain and crystal grain boundary, and to provide especially a formation method of a crystalline semiconductor film, in which orientation of crystal grain is controlled. SOLUTION: Example is taken in the subject and a semiconductor film having metallic element is formed for expediting crystallization of an amorphous semiconductor film, an amorphous semiconductor film is formed in contact with the semiconductor film; a crystalline semiconductor film is formed with orientation controlled by metallic element; and a crystalline semiconductor film is formed by using the above semiconductor film as seed crystal. Especially, the amorphous semiconductor film for performing crystallization and the seed crystal touch point-like. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005079198(A) 申请公布日期 2005.03.24
申请号 JP20030305369 申请日期 2003.08.28
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ISHIKAWA AKIRA
分类号 H01L51/50;H01L21/20;H01L21/336;H01L29/786;H05B33/14;(IPC1-7):H01L21/20 主分类号 H01L51/50
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