发明名称 SOLID STATE IMAGING APPARATUS AND ITS MANUFACTURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a solid state imaging apparatus and its manufacturing method easy in mixed color prevention, by improving open sensitivity and making an incidence angle wide. <P>SOLUTION: There are stacked on a photodiode 1 formed on a silicon semiconductor substrate 10 a flattened transparent insulating film 2 comprising BPSG (boron-phosphorous-silicate glass) or the like, an upward convex intralayer lens 3 of high refractive index (n>1.8), a color filter layer 5 composed of a color resist containing dyestuff or pigment, a transparent film 6 comprising an acrylic-based transparent resin, and a microlens (or called a top lens) 7. The color filter 5 is directly attached onto the intralayer lens 3. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005079344(A) 申请公布日期 2005.03.24
申请号 JP20030307848 申请日期 2003.08.29
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SAKO HIROSHI;ICHIKAWA MICHIYO;NISHI YOSHIAKI
分类号 G02B5/20;G02B3/00;H01L27/00;H01L27/14;H01L27/146;H01L31/10;H04N5/335;H04N5/369;(IPC1-7):H01L27/14 主分类号 G02B5/20
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