发明名称 Method of making a memory cell with polished insulator layer
摘要 An improved method of making a flash memory cell including a substrate having a floating gate of a first thickness includes depositing an insulator on the substrate and over the floating gate. The insulator is preferably a high quality oxide. A portion of the insulator not covering the floating gate has a second thickness which is greater than the first thickness of the floating gate. The method further includes polishing the insulator until the second thickness is substantially equal to the first thickness. Polishing results in a planar floating gate and insulator layer. The method further includes sequentially depositing a dielectric layer and a control gate layer on the planar floating gate and insulator layer and then etching these layers to complete the stacked gate structure of the memory cell.
申请公布号 US6867097(B1) 申请公布日期 2005.03.15
申请号 US19990430366 申请日期 1999.10.28
申请人 ADVANCED MICRO DEVICES, INC. 发明人 RAMSBEY MARK T.;OGLE ROBERT B.;HSIAO TOMMY C.;HUI ANGELA T.;PHAM TUAN DUC;PLAT MARINA V.;SHEN LEWIS
分类号 H01L21/28;H01L21/3105;H01L21/314;H01L21/316;H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/28
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