发明名称 |
ETCHING METHOD AND METHOD OF MANUFACTURING CIRCUIT DEVICE USING THE SAME |
摘要 |
An etching method and a method for manufacturing a circuit device using the same are provided to improve etching factors and to decrease the size of a resultant conductive pattern by using a resist with a widening lower portion as an etching mask. An etching resist(10) is formed on a material to be etched(11). The etching resist(10) is selectively deformed by selectively exposing the etching resist to a light using an exposure mask(14). A residual region(10B) with a cross section has a lower portion which is larger than an upper portion. A liquid is used to remove the etching resist(10) outside the residual region(10B). The material to be etched(11) is etched by using the residual region(10B) as a mask. |
申请公布号 |
KR20050025285(A) |
申请公布日期 |
2005.03.14 |
申请号 |
KR20040067381 |
申请日期 |
2004.08.26 |
申请人 |
SANYO ELECTRIC CO., LTD. |
发明人 |
MORI, SHINYA |
分类号 |
G03F7/40;C23F1/00;G03F7/20;G03F7/30;H01L21/027;H01L21/3213;H01L21/48;H01L23/31;H05K1/18;H05K3/00;H05K3/06;H05K3/20;H05K3/28;H05K3/34;H05K3/46 |
主分类号 |
G03F7/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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