发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
A semiconductor memory device is provided to reduce or eliminate a difference in bit line load resistance due to the location of a memory element by regulating the source-side and drain-side bit line load resistance of a memory cell, and to reduce or eliminate a variation in resistance value from a main bit line to a sub bit line. A semiconductor memory device comprises plural memory elements; more than one of bit line in which a memory operation is performed; a load resistance regulating circuit(2) for changing a resistance value in order to reduce or eliminate a difference in bit line load resistance due to a location of the memory element. Wherein, the load resistance regulating circuit(2) regulates a resistance value based on address information in order to reduce or eliminate the difference in a load resistance of a bit line in a row direction.
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申请公布号 |
KR20050025076(A) |
申请公布日期 |
2005.03.11 |
申请号 |
KR20040070422 |
申请日期 |
2004.09.03 |
申请人 |
SHARP CORPORATION |
发明人 |
ITO, NOBUHIKO;UEDA, NAOKI;YAMAUCHI, YOSHIMITSU |
分类号 |
G11C16/06;G11C7/12;G11C16/24;(IPC1-7):G11C7/12 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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