发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 A semiconductor memory device is provided to reduce or eliminate a difference in bit line load resistance due to the location of a memory element by regulating the source-side and drain-side bit line load resistance of a memory cell, and to reduce or eliminate a variation in resistance value from a main bit line to a sub bit line. A semiconductor memory device comprises plural memory elements; more than one of bit line in which a memory operation is performed; a load resistance regulating circuit(2) for changing a resistance value in order to reduce or eliminate a difference in bit line load resistance due to a location of the memory element. Wherein, the load resistance regulating circuit(2) regulates a resistance value based on address information in order to reduce or eliminate the difference in a load resistance of a bit line in a row direction.
申请公布号 KR20050025076(A) 申请公布日期 2005.03.11
申请号 KR20040070422 申请日期 2004.09.03
申请人 SHARP CORPORATION 发明人 ITO, NOBUHIKO;UEDA, NAOKI;YAMAUCHI, YOSHIMITSU
分类号 G11C16/06;G11C7/12;G11C16/24;(IPC1-7):G11C7/12 主分类号 G11C16/06
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