发明名称 ELECTRON BEAM EXPOSURE DEVICE AND EXPOSURE METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a device capable of fixing without strongly pulling the pattern of a mask especially having no beams in an unmagnified mask used by an electron beam type exposure system. <P>SOLUTION: The unmagnified mask and a wafer are arranged to be vertical, thus totally preventing the pattern of the unmagnified mask from being bent and dispensing with strongly pulling the pattern even in the mask especially having no beams. Besides, a gap between the mask and the wafer can be reduced. There is no need for strongly pulling the pattern of a stencil mask, thus pasting an extremely thin membrane to the pattern. As a result, a mask called as a membrane mask can be utilized even if the acceleration voltage of electron beams is low, for example few kV, and pattern can be formed by a single exposure even in a doughnut-shaped pattern. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005064253(A) 申请公布日期 2005.03.10
申请号 JP20030292528 申请日期 2003.08.12
申请人 OMI TADAHIRO 发明人 OMI TADAHIRO;SUGAWA SHIGETOSHI;YANAGIDA KIMIO;TAKEHISA KIWAMU
分类号 G03F7/20;G03F1/20;G03F1/68;H01J37/305;H01J37/317;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
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