| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing device for transmitting a high-speed signal, concerning the testing device for testing an electronic device. SOLUTION: This testing device is equipped with: a test head; a pattern generation part for generating a device test pattern for testing the electronic device and a test head test pattern for testing the test head; an optical communication means for converting the device test pattern generated by the pattern generation part into an optical communication signal, and supplying it to the test head; a means for supplying the test head test pattern generated by the pattern generation part to the test head; and a determination part for receiving an output signal from the electronic device and determining the quality of the electronic device. The test head has a storage part for storing the device test pattern and the test head test pattern, and a means for converting into an electric signal, the device test pattern converted into the optical communication signal received from the optical communication means. COPYRIGHT: (C)2005,JPO&NCIPI
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