发明名称 Method and apparatus for chemical mechanical polishing
摘要 A polishing device (16) is hermetically accommodated in a chamber (13) containing an atmosphere having a composition different from the ambient air, so that the atmosphere around the polishing device (16) is altered into the composition different from the ambient air, and voltage is applied between a wafer (W) and a polishing pad (34a) to polish the wafer (W) with an electrolytic effect. The polishing device (16) has the atmosphere containing extremely less oxygen, preventing a surface of the wafer (W) from oxidation and thereby providing a constant polishing rate. <IMAGE>
申请公布号 EP1362670(A3) 申请公布日期 2005.03.02
申请号 EP20030011243 申请日期 2003.05.16
申请人 TOKYO SEIMITSU CO.,LTD.;DOI, TOSHIRO 发明人 DOI, TOSHIRO;FUJITA, TAKASHI
分类号 B24B37/00;H01L21/304 主分类号 B24B37/00
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