发明名称 DEVICE FOR MEASUREMENT OF HIGH VALUES OF COMPLEX PERMITTIVITY OF LOW-IMPEDANCE MATERIALS AT MICROWAVE FREQUENCIES
摘要 FIELD: radio measurements of low-impedance dielectric materials at microwave frequencies, in particular, measurement of the complex relative permittivity and the loss tangent of a dielectric of composite materials characterized by high values of complex relative permittivity and conductance. ^ SUBSTANCE: measurements are taken with the aid of a waveguide standing-wave resonator, the values of the complex permittivity are determined by the measured values of resonance frequency, attenuation and quality factor. ^ EFFECT: enhanced precision of measurement of the value of the complex permittivity of low-impedance materials at microwave frequencies, having high values of complex permittivity . ^ 2 cl
申请公布号 RU2247399(C1) 申请公布日期 2005.02.27
申请号 RU20040101740 申请日期 2004.01.20
申请人 发明人 DMITRIENKO G.V.;TREFILOV N.A.
分类号 G01R27/26 主分类号 G01R27/26
代理机构 代理人
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