发明名称 ENABLE SIGNAL GENERATING CIRCUIT FOR LOCAL INPUT/OUTPUT SENSE AMPLIFIER AND ENABLE SIGNAL GENERATING CIRCUIT FOR INPUT/OUTPUT SENSE AMPLIFIER IN SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: An enable signal generating circuit for a local I/O(input/output) sense amplifier and an enable signal generating circuit for an I/O sense amplifier are provided to have develop margin of a local I/O line pair and a global I/O line pair by controlling the enable time according to the frequency. CONSTITUTION: An enable signal generating circuit for a local I/O(input/output) sense amplifier in a semiconductor memory device, comprises tDAC register(34) for supplying tDAC information; a delay means(32) for receiving a column latch signal(COLLAT), a write signal(WRITE) and an output signal from the tDAC, and for outputting an enable signal(PLIOSE) for the local I/O sense amplifier. And an enable signal generating circuit for an I/O sense amplifier in a semiconductor memory device, comprises tDAC register for supplying tDAC information; a delay means for receiving a column cycle signal(COLCYC), a write signal(WRITE) and an output signal from the tDAC, and for outputting an enable signal(PIOSE) for the I/O sense amplifier.
申请公布号 KR20050015206(A) 申请公布日期 2005.02.21
申请号 KR20030053915 申请日期 2003.08.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, DONG SU
分类号 G11C11/4091;(IPC1-7):G11C11/409 主分类号 G11C11/4091
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