发明名称 SYSTEM FOR VERIFYING SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To increase the speed at which a semiconductor integrated circuit is verified through simulations. SOLUTION: This system comprises a compiler 105 which creates a circuit database 106 on receiving the circuit descriptions 102, 103 of a target semiconductor integrated circuit, and a circuit analysis part 107 which receives the circuit database 106; analyzes circuits within the semiconductor integrated circuit based on the circuit database 106; determines the time to change the level of abstraction of the circuits; and creates a simulation object 108. The system includes a simulation process part 109 which receives the input of the simulation object 108 and simulates the semiconductor integrated circuit based on the simulation object 108. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005037995(A) 申请公布日期 2005.02.10
申请号 JP20030197112 申请日期 2003.07.15
申请人 TOSHIBA CORP 发明人 YASUKURA KENICHI;TOKUNAGA CHIKAKO;MATSUMOTO TAKASHI
分类号 G01R31/28;G06F11/00;G06F17/50;G11C29/54;(IPC1-7):G06F17/50 主分类号 G01R31/28
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