发明名称 METHOD FOR FORMING TRANSISTOR OF SEMICONDUCTOR DEVICE TO IMPROVE CURRENT DRIVING ABILITY
摘要 PURPOSE: A method for forming a transistor of a semiconductor device is provided to improve a current driving ability by forming a gate oxide layer having a native oxide layer and an oxynitride layer on a semiconductor substrate in a cell region. CONSTITUTION: The first gate oxide layer(33) made of an oxynitride layer is formed in a cell region and a peripheral circuit region on a semiconductor substrate(31). Only the cell part of the first gate oxide layer is left by a photolithography process using a mask for forming a dual gate oxide layer. A gate electrode in which the second gate oxide layer(37) and the first gate oxide layer are stacked in the cell region in a subsequent process while a gate electrode including the second gate oxide layer is formed in the peripheral circuit region.
申请公布号 KR20050014225(A) 申请公布日期 2005.02.07
申请号 KR20030052743 申请日期 2003.07.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 MIN, DOO HONG
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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