发明名称 |
METHOD FOR FORMING TRANSISTOR OF SEMICONDUCTOR DEVICE TO IMPROVE CURRENT DRIVING ABILITY |
摘要 |
PURPOSE: A method for forming a transistor of a semiconductor device is provided to improve a current driving ability by forming a gate oxide layer having a native oxide layer and an oxynitride layer on a semiconductor substrate in a cell region. CONSTITUTION: The first gate oxide layer(33) made of an oxynitride layer is formed in a cell region and a peripheral circuit region on a semiconductor substrate(31). Only the cell part of the first gate oxide layer is left by a photolithography process using a mask for forming a dual gate oxide layer. A gate electrode in which the second gate oxide layer(37) and the first gate oxide layer are stacked in the cell region in a subsequent process while a gate electrode including the second gate oxide layer is formed in the peripheral circuit region.
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申请公布号 |
KR20050014225(A) |
申请公布日期 |
2005.02.07 |
申请号 |
KR20030052743 |
申请日期 |
2003.07.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
MIN, DOO HONG |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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