摘要 |
<p>An x-ray diffraction measurement apparatus for measuring a sample, having an x-ray source and detector coupled together in a combination for coordinated rotation around the sample, such that x-ray diffraction data can be taken at multiple phi angles. The apparatus may provide a pole figure representation of crystal orientation of the sample, wherein the pole figure represents the crystal alignment, and a full width half maximum value is calculated from the pole figure for crystal alignment quantification. Data may be taken at discrete positions along a length of the sample, and the sample is in a fixed position during measuring; or data may be taken continuously along a length of the article, as the sample continuously moves along its length in a movement path between the source and detector. The sample may be in the form of a tape, linearly passing through a measurement zone.</p> |
申请人 |
X-RAY OPTICAL SYSTEMS, INC.;SUPERPOWER, INC.;GIBSON, DAVID M.;GIBSON, WALTER M.;HUANG, HUAPENG;REEVES, JODI, LYNN |
发明人 |
GIBSON, DAVID M.;GIBSON, WALTER M.;HUANG, HUAPENG;REEVES, JODI, LYNN |