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发明名称
A CIRCUIT ARRANGEMENT FOR MEASURING STEADY-STATE CHARACTERISTICS OF SEMICONDUCTOR DEVICES
摘要
申请公布号
GB1242791(A)
申请公布日期
1971.08.11
申请号
GB19690000507
申请日期
1969.01.03
申请人
VEB ELEKTROMAT
发明人
JURGEN TREETZ
分类号
G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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