发明名称 |
RESIDUAL GAS ANALYZING APPARATUS OF SEMICONDUCTOR MANUFACTURING EQUIPMENT FOR REMOVING UNNECESSARY MAN-HOUR LOSS AND PROLONGING LIFETIME OF HEATER FILAMENT |
摘要 |
PURPOSE: A residual gas analyzing apparatus of semiconductor manufacturing equipment is provided to suppress an unnecessary man-hour loss and to prolong the lifetime of a heater filament by driving a heater of the residual gas analyzing apparatus interdependent on a heater driving signal of a process chamber. CONSTITUTION: A residual gas analyzing apparatus includes a heater and relay. The heater(92) includes a filament. The relay is used for supplying selectively power supply to the heater according to a heater on/off signal of a process chamber. The relay supplies power supply to the heater in a heater on signal state of the process chamber.
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申请公布号 |
KR20050011377(A) |
申请公布日期 |
2005.01.29 |
申请号 |
KR20030050460 |
申请日期 |
2003.07.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, SEON WOO |
分类号 |
H01L21/205;C23C16/52;G01M3/04;H01J49/04;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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