发明名称 METHOD FOR FABRICATING NVM DEVICE TO UNIFORMLY REDUCE RESISTANCE OF GATE
摘要 PURPOSE: A method for fabricating an NVM(non-volatile memory) device is provided to uniformly reduce the resistance of a gate by performing a uniform ion implantation process and a heat process on a control gate electrode surrounding a floating gate electrode. CONSTITUTION: A semiconductor substrate(110) is prepared which includes a tunnel oxide layer(116) and a floating gate electrode(118). An insulation layer and a conductive layer(122) for a control gate are formed along the step on the resultant structure. Impurity ions are implanted into the conductive layer for the control gate. The insulation layer and the conductive layer for the control gate are patterned to form a control gate electrode surrounding the floating gate electrode.
申请公布号 KR20050009576(A) 申请公布日期 2005.01.25
申请号 KR20030049326 申请日期 2003.07.18
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 SA, SEUNG HOON
分类号 H01L27/115;(IPC1-7):H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项
地址