发明名称 |
METHOD FOR FABRICATING NVM DEVICE TO UNIFORMLY REDUCE RESISTANCE OF GATE |
摘要 |
PURPOSE: A method for fabricating an NVM(non-volatile memory) device is provided to uniformly reduce the resistance of a gate by performing a uniform ion implantation process and a heat process on a control gate electrode surrounding a floating gate electrode. CONSTITUTION: A semiconductor substrate(110) is prepared which includes a tunnel oxide layer(116) and a floating gate electrode(118). An insulation layer and a conductive layer(122) for a control gate are formed along the step on the resultant structure. Impurity ions are implanted into the conductive layer for the control gate. The insulation layer and the conductive layer for the control gate are patterned to form a control gate electrode surrounding the floating gate electrode.
|
申请公布号 |
KR20050009576(A) |
申请公布日期 |
2005.01.25 |
申请号 |
KR20030049326 |
申请日期 |
2003.07.18 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
SA, SEUNG HOON |
分类号 |
H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|