发明名称 Vertical gate CMOS with lithography-independent gate length
摘要 Formation of elements of a vertical transistor is described, particularly, a gate-source-drain arrangement of a CMOS transistor. Vertical transistors are used frequently in the integrated circuit art. Accordingly, improved methods for their formation, which are not limited by constraints of photolithography, have great utility and importance. Those of skill in the art will appreciate that the techniques described may be used to fabricate other types of devices as well. For example, junctions of a bipolar transistor (as well as other device junction types) may be fabricated using the methods described herein.
申请公布号 US6846709(B1) 申请公布日期 2005.01.25
申请号 US20040761876 申请日期 2004.01.21
申请人 ATMEL CORPORATION 发明人 LOJEK BOHUMIL
分类号 H01L21/28;H01L21/336;H01L21/8238;H01L29/423;H01L29/786;(IPC1-7):H01L21/823;H01L27/10;H01L29/73 主分类号 H01L21/28
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