发明名称 METHOD OF LEARNING A KNOWLEDGE-BASED DATABASE USED IN AUTOMATIC DEFECT CLASSIFICATION
摘要 The invention relates to a method of learning a knowledge-based database used in automatic defect classification. According to said method, the user is spared a series of entries as the system carries out an automatic learn mode, which requires a reduced number of user entries.
申请公布号 WO2005006002(A2) 申请公布日期 2005.01.20
申请号 WO2004EP51008 申请日期 2004.06.03
申请人 LEICA MICROSYSTEMS SEMICONDUCTOR GMBH;SOENKSEN, DIRK;FRIEDRICH, RALF;DRAEGER, ANDREAS;SCHUPP, DETLEF;VAN LUU, THIN;LANGER, WOLFGANG 发明人 SOENKSEN, DIRK;FRIEDRICH, RALF;DRAEGER, ANDREAS;SCHUPP, DETLEF;VAN LUU, THIN;LANGER, WOLFGANG
分类号 G01N21/95;G06T7/00 主分类号 G01N21/95
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