发明名称 METHOD FOR PREVENTING ADHESION OF RESIST TO BACKSIDE OF TEST SAMPLE AND CHUCKING DEVICE OF SAMPLE USED FOR SAME METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for preventing a wrapping-arround of a resist to a backside of a test smaple causing no scratch on the backside of the test smaple. <P>SOLUTION: When coating the resist on the surface of the test sample held on a rotating table and preventing the wrap-arround of the resin on the surface of the test sample, the sample is held on the rotating table at even gaps, a pressure of an inside of the gap is kept higher than that of an ouside, the wrap-around of the resist coated on the backside of the sample from a periphery area to the inner area of the backside of the sample is prevented. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005019755(A) 申请公布日期 2005.01.20
申请号 JP20030183484 申请日期 2003.06.26
申请人 NANOMETRIC TECHNOLOGY INC 发明人 YOKOYAMA YASUAKI
分类号 G03F7/16;B05C11/08;B05D1/40;H01L21/027 主分类号 G03F7/16
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