发明名称 FILM DEPOSITION APPARATUS, FILM DEPOSITION METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To enhance adhesiveness of a barrier metal film to an insulating layer without providing any cooling mechanism on a reverse sputtering apparatus. SOLUTION: When reverse sputtering is completed in a reverse sputtering chamber C2, a wafer W with the temperature thereof raised by the reverse sputtering is carried into a cooling chamber C3, and the wafer W is cooled in the cooling chamber C3, and carried into a sputtering chamber C4 to deposit a Ti film on the wafer W. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005008902(A) 申请公布日期 2005.01.13
申请号 JP20030170700 申请日期 2003.06.16
申请人 SEIKO EPSON CORP 发明人 ENDO MAMORU
分类号 C23C14/34;C23C14/14;C23C16/34;H01L21/302;H01L21/768;(IPC1-7):C23C14/34 主分类号 C23C14/34
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