发明名称 Apparatus and method for non-contact temperature measurement
摘要 A non-contact temperature measuring apparatus is provided with spherical semiconductors mounted on a measurement object and a data collector disposed out of contact with the measurement object. Each spherical semiconductor has an electronic circuit which is operable using internal power created from electromagnetic energy supplied from the data collector, to thereby obtain temperature information. The data collector contactlessly determines a temperature of or a temperature distribution across the measurement object based on pieces of temperature information transmitted from the spherical semiconductors specified by pieces of identification information sequentially transmitted from the data collector.
申请公布号 US6840670(B2) 申请公布日期 2005.01.11
申请号 US20010997065 申请日期 2001.11.29
申请人 YAMATAKE CORPORATION 发明人 KANO SHIRO
分类号 G01K1/02;G01K7/00;G06K19/00;H01L21/66;(IPC1-7):G01K1/16 主分类号 G01K1/02
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