发明名称 METHOD OF FORMING LOW RESISTIVITY METAL LINE OF SEMICONDUCTOR DEVICE USING ENHANCED METAL LINE FORMING PROCESS
摘要 PURPOSE: A method of manufacturing a metal line of a semiconductor device is provided to reduce the resistivity of a metal material by forming a metal line on a seed layer made of an amorphous metallic thin film. CONSTITUTION: An interlayer dielectric(14) with a contact hole for exposing a lower layer(12) to the outside is formed on a semiconductor substrate(10). A seed layer(20) made of an amorphous metallic thin film is formed along the upper surface of the resultant structure. A metal film(22) for filling completely the contact hole is formed thereon.
申请公布号 KR20050002094(A) 申请公布日期 2005.01.07
申请号 KR20030043405 申请日期 2003.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HWANG, EUI SEONG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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