发明名称 |
METHOD OF FORMING LOW RESISTIVITY METAL LINE OF SEMICONDUCTOR DEVICE USING ENHANCED METAL LINE FORMING PROCESS |
摘要 |
PURPOSE: A method of manufacturing a metal line of a semiconductor device is provided to reduce the resistivity of a metal material by forming a metal line on a seed layer made of an amorphous metallic thin film. CONSTITUTION: An interlayer dielectric(14) with a contact hole for exposing a lower layer(12) to the outside is formed on a semiconductor substrate(10). A seed layer(20) made of an amorphous metallic thin film is formed along the upper surface of the resultant structure. A metal film(22) for filling completely the contact hole is formed thereon.
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申请公布号 |
KR20050002094(A) |
申请公布日期 |
2005.01.07 |
申请号 |
KR20030043405 |
申请日期 |
2003.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HWANG, EUI SEONG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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