发明名称 INFORMATION ACQUISITION METHOD FOR HEIGHT OF TEST PIECE
摘要 PROBLEM TO BE SOLVED: To find distance in the radiated direction of charged particles at high precision and at high speed. SOLUTION: The difference in height is found by carrying out fitting compensation process using a plurality of focal degree evaluating values in arbitrary parts, in which the positions are detected on a plane of a plurality of test piece images with different focal positions and carrying out detection of the focal position from the maximum value (minimum value) of obtained curves Pa and Pb. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005005055(A) 申请公布日期 2005.01.06
申请号 JP20030165435 申请日期 2003.06.10
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YAMAGUCHI SATOSHI;OZAWA YASUHIKO;SATO MITSUGI;TAKANE ATSUSHI
分类号 G01B15/00;H01J37/147;H01J37/21;H01J37/22;H01J37/28;H01L21/027;(IPC1-7):H01J37/28 主分类号 G01B15/00
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