发明名称 |
INFORMATION ACQUISITION METHOD FOR HEIGHT OF TEST PIECE |
摘要 |
PROBLEM TO BE SOLVED: To find distance in the radiated direction of charged particles at high precision and at high speed. SOLUTION: The difference in height is found by carrying out fitting compensation process using a plurality of focal degree evaluating values in arbitrary parts, in which the positions are detected on a plane of a plurality of test piece images with different focal positions and carrying out detection of the focal position from the maximum value (minimum value) of obtained curves Pa and Pb. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005005055(A) |
申请公布日期 |
2005.01.06 |
申请号 |
JP20030165435 |
申请日期 |
2003.06.10 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
YAMAGUCHI SATOSHI;OZAWA YASUHIKO;SATO MITSUGI;TAKANE ATSUSHI |
分类号 |
G01B15/00;H01J37/147;H01J37/21;H01J37/22;H01J37/28;H01L21/027;(IPC1-7):H01J37/28 |
主分类号 |
G01B15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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