发明名称 Integrated circuit devices with metal-insulator-metal capacitors and methods of forming the same
摘要 A conductive contact plug extends through an opening in the dielectric layer to contact the substrate and includes a widened pad portion extending onto the dielectric layer adjacent the opening. An ohmic pattern is disposed on the pad portion of the plug, and a barrier pattern is disposed on the ohmic pattern. A concave first capacitor electrode is disposed on the barrier pattern and defines a cavity opening away from the substrate. A capacitor dielectric layer conforms to a surface of the first capacitor electrode and a second capacitor electrode is disposed on the capacitor dielectric layer opposite the first capacitor electrode. Sidewalls of the ohmic pattern, the barrier pattern and the pad portion of the contact plug may be substantially coplanar, and the device may further include an etch stopper layer conforming to at least sidewalls of the ohmic pattern, the barrier pattern and the pad portion of the contact plug. Related fabrication methods are described.
申请公布号 US2004262661(A1) 申请公布日期 2004.12.30
申请号 US20040807000 申请日期 2004.03.23
申请人 KIM KI-CHUL;KIM YOUNG-SUN;NAM GAB-JIN;KIM SUNG-TAE;KWON THOMAS JONGWAN;CHOI HAN-MEI;LIM JAE-SOON 发明人 KIM KI-CHUL;KIM YOUNG-SUN;NAM GAB-JIN;KIM SUNG-TAE;KWON THOMAS JONGWAN;CHOI HAN-MEI;LIM JAE-SOON
分类号 H01L21/02;H01L21/3205;H01L21/8242;H01L27/108;(IPC1-7):H01L29/94 主分类号 H01L21/02
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