摘要 |
Puncture sequences S<SUB>1</SUB>, S<SUB>2</SUB>, etc. for code rates R<SUB>1</SUB>, R<SUB>2</SUB>, etc. less than a maximum code rate R<SUB>max </SUB>are defined subsets of a maximum rate puncture sequence S<SUB>max </SUB>that corresponds to the maximum code rate R<SUB>max</SUB>. Each puncture sequence S<SUB>i </SUB>for a code rate R<SUB>i </SUB>is related to the puncture sequence S<SUB>i-1</SUB>, of the previous code rate R<SUB>i-1</SUB>, and preferably S<SUB>1</SUB><U STYLE="SINGLE">⊂S<SUB>2</SUB><U STYLE="SINGLE">⊂ . . . <U STYLE="SINGLE">⊂S<SUB>max-1</SUB><U STYLE="SINGLE">⊂S<SUB>max</SUB>. The puncture sequences are groups of one or more memory elements, each of which is a variable degree, a variable node location, a check degree, or a check node location. A method for deriving such a puncture sequence for variable code rates is also disclosed. |