发明名称 |
Lithographic apparatus and device manufacturing method |
摘要 |
The apparatus has a radiation system to provide a projection beam of radiation. A high precision liquid supply system (18) supplies a liquid between a projection system (PL) and a substrate (W). The system (18) is arranged such that a space between the liquid and the substrate is not occupied by the liquid with a high refractive index. A surface of the liquid closest to the substrate is parallel to the substrate. An independent claim is also included for a device manufacturing method. |
申请公布号 |
EP1491956(A1) |
申请公布日期 |
2004.12.29 |
申请号 |
EP20030254116 |
申请日期 |
2003.06.27 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
KOLESNYCHENKO, ALEKSEY YURIEVICH;VAN DER WERF, JAN EVERT |
分类号 |
G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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