发明名称 Semiconductor structure containing field oxide and method for fabricating the same
摘要 A semiconductor structure containing a field oxide and a process for fabricating the semiconductor structure. The semiconductor structure includes a semiconductor substrate including an isolation region and an active region; a field oxide formed on the semiconductor substrate in the isolation region; a first pad layer formed on the semiconductor substrate in the active region; a second pad layer formed on the semiconductor substrate not covered by the first pad layer, wherein the second pad layer has a smaller thickness than the first pad layer; a mask layer formed on the first pad layer, wherein the mask layer has a larger width than the first pad layer to form a cavity beneath the mask layer and next to the first pad layer; and a mask filler filled in the cavity. By means of the local pad film thinning technique and by forming a mask filler to grow the field oxide layer, the bird's beak encroachment and the thinning effect of the field oxide layer can both be inhibited.
申请公布号 US2004259323(A1) 申请公布日期 2004.12.23
申请号 US20010024274 申请日期 2001.12.17
申请人 KING WEI-KANG 发明人 KING WEI-KANG
分类号 H01L21/762;(IPC1-7):H01L21/76;H01L29/00 主分类号 H01L21/762
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