发明名称 Sample-setting moving stage, manufacturing apparatus for circuit pattern, and inspection apparatus for circuit pattern
摘要 To realize the temperature control of the sample-setting portion and enable to perform exposure or inspection of samples accurately while preventing the generation of dust, deterioration of the degree of vacuum and contamination in a vacuum atmosphere. (Means of Solving the Problems) The top table 21 or sample holding mechanism 7 is equipped with a temperature sensor 23, the flow path 251 of the heat-exchanging medium 241 is provided inside the non-moving fixed side guide member 181, and the temperature of the sample-setting portion is controlled through the control of the medium 241. Since the flow path 251 of the heat-exchanging medium 241 is located in a stationary portion, it is possible to control the temperature of the sample-setting portion while preventing the generation of dust due to flexible piping, damage to vacuum pump and contamination in a vacuum atmosphere caused by the heat-exchanging medium 241.
申请公布号 US2004250776(A1) 申请公布日期 2004.12.16
申请号 US20040809795 申请日期 2004.03.26
申请人 MIZUOCHI MASAKI;FUKUSHIMA YOSHIMASA;KUBO TADAYUKI 发明人 MIZUOCHI MASAKI;FUKUSHIMA YOSHIMASA;KUBO TADAYUKI
分类号 G01N1/28;C23C16/455;G03F7/20;H01J37/20;H01L21/027;(IPC1-7):C23C16/00 主分类号 G01N1/28
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