发明名称 |
Sample-setting moving stage, manufacturing apparatus for circuit pattern, and inspection apparatus for circuit pattern |
摘要 |
To realize the temperature control of the sample-setting portion and enable to perform exposure or inspection of samples accurately while preventing the generation of dust, deterioration of the degree of vacuum and contamination in a vacuum atmosphere. (Means of Solving the Problems) The top table 21 or sample holding mechanism 7 is equipped with a temperature sensor 23, the flow path 251 of the heat-exchanging medium 241 is provided inside the non-moving fixed side guide member 181, and the temperature of the sample-setting portion is controlled through the control of the medium 241. Since the flow path 251 of the heat-exchanging medium 241 is located in a stationary portion, it is possible to control the temperature of the sample-setting portion while preventing the generation of dust due to flexible piping, damage to vacuum pump and contamination in a vacuum atmosphere caused by the heat-exchanging medium 241.
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申请公布号 |
US2004250776(A1) |
申请公布日期 |
2004.12.16 |
申请号 |
US20040809795 |
申请日期 |
2004.03.26 |
申请人 |
MIZUOCHI MASAKI;FUKUSHIMA YOSHIMASA;KUBO TADAYUKI |
发明人 |
MIZUOCHI MASAKI;FUKUSHIMA YOSHIMASA;KUBO TADAYUKI |
分类号 |
G01N1/28;C23C16/455;G03F7/20;H01J37/20;H01L21/027;(IPC1-7):C23C16/00 |
主分类号 |
G01N1/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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