发明名称 POLISHING PAD AND POLISHING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing pad which improves flattening of the surface of a semiconductor device to easily perform fine working for increasing resolution on the surface of the semiconductor device. <P>SOLUTION: This polishing pad is used for polishing a polishing object by being adhered to a polishing plate. In the pad, at least two or more curved grooves which do not mutually cross are formed on the surface and the curves are characterized by curves except a closed curve. The pad is adhered to the rotating polishing plate, and the polishing object is held in a state of the surface being confronted with the pad by a holder rotated by being deviated from a rotation center of the polishing plate on an upper side of the polishing plate. Polishing agent is supplied to the pad, and the polishing plate and the holder are rotated, to polish the polishing object. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004345014(A) 申请公布日期 2004.12.09
申请号 JP20030143300 申请日期 2003.05.21
申请人 HITACHI CHEM CO LTD 发明人 SUZUKI MASAO;YOSHIDA MASATO;SHIMAMURA YASUO
分类号 B24B37/20;B24B37/24;B24B37/26;H01L21/304 主分类号 B24B37/20
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