High-speed semiconductor memory modules test method, especially for DDR-DRAM, in which a number of suitable memory control units are selected as test memory control units and provided as part of a test device

摘要

Test method for semiconductor memory modules, especially high speed DDR-DRAMS, that are operated in conjunction with a memory control unit. According to the method a number of suitable memory control units are selected as test memory control units (44) and are provided as part of a test device (3). The test data signals given out from the semiconductor memory modules under test are evaluated using the test memory control units. An independent claim is made for a test device for semiconductor memory modules.