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发明名称
System zum Vergleich von Streifenmuster
摘要
申请公布号
DE69827177(D1)
申请公布日期
2004.12.02
申请号
DE19986027177
申请日期
1998.02.27
申请人
NEC CORP., TOKIO/TOKYO
发明人
HIRATSUKA, SEIICHI;HOSHINO, YUKIO;KUNITAKA, JUNICHI;TAKAHASHI, YOSHIHIDE
分类号
G06T7/00;G06K9/00;(IPC1-7):G06K9/00
主分类号
G06T7/00
代理机构
代理人
主权项
地址
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