发明名称 |
METHOD OF FORMING LOW PRESSURE SILICON NITRIDE LAYER WITHOUT LIFTING |
摘要 |
PURPOSE: A method of forming a low pressure silicon nitride layer is provided to prevent the silicon nitride layer from being lifted by forming the silicon nitride layer on one side alone of one wafer in a unit chamber. CONSTITUTION: A unit chamber(10) with one heater(11) is provided. A wafer(12) is loaded on the heater. A silicon nitride layer is formed on one surface of the wafer by using an LPCVD(Low Pressure Chemical Vapor Deposition). The LPCVD is performed by supplying one selected from a group consisting of NH3/SiH4 and NH3/SiCl2H2 at a temperature of 400 °C or more under a pressure state of l Torr to atmospheric conditions.
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申请公布号 |
KR20040100767(A) |
申请公布日期 |
2004.12.02 |
申请号 |
KR20030033234 |
申请日期 |
2003.05.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
EUN, YONG SEOK;JUNG, SEUNG HUN;KIM, HYEONG GYUN |
分类号 |
H01L21/205;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
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