发明名称 A METHOD FOR MAKING A SEMICONDUCTOR DEVICE HAVING A METAL GATE ELECTRODE
摘要 <p>A method for making a semiconductor device is described. That method comprises forming a dielectric layer on a substrate, and forming an impurity containing metal layer on the dielectric layer. A metal gate electrode is then formed from the impurity containing metal layer. Also described is a semiconductor device that comprises a metal gate electrode that is formed on a dielectric layer, which is formed on a substrate. The metal gate electrode includes a sufficient amount of an impurity to shift the workfunction of the metal gate electrode by at least about 0.1 eV.</p>
申请公布号 WO2004105138(A1) 申请公布日期 2004.12.02
申请号 WO2003US40674 申请日期 2003.12.18
申请人 INTEL CORPORATION 发明人 CHAU, ROBERT;DOCZY, MARK;KUHN, MARKUS
分类号 H01L21/28;H01L21/8238;H01L29/51;(IPC1-7):H01L29/51 主分类号 H01L21/28
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