发明名称 INSPECTION METHOD AND INSPECTION DEVICE FOR SECONDARY BATTERY
摘要 PROBLEM TO BE SOLVED: To provide a method and a device for detecting a defect of a secondary battery, capable of accurately distinguishing internal short-circuiting or potential short-circuiting, without damaging an electrode of a normal battery. SOLUTION: The inspection method comprises determining failure of an electrode, if current made to flow in a circuit when applying voltage to the electrode is larger than the current made to flow when applying voltage to a normal electrode. The voltage to be applied to the electrode is an AC voltage having a voltage amplitude in a range where partial discharge does not occur in a normal electrode. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004342476(A) 申请公布日期 2004.12.02
申请号 JP20030138269 申请日期 2003.05.16
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 FUJIKAWA KAZUSATO;TSUTSUMI SHUJI;KUME TOSHIRO;SHIMADA MIKIYA
分类号 H01M10/04;H01M10/48;(IPC1-7):H01M10/04 主分类号 H01M10/04
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