发明名称 |
INSPECTION METHOD AND INSPECTION DEVICE FOR SECONDARY BATTERY |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and a device for detecting a defect of a secondary battery, capable of accurately distinguishing internal short-circuiting or potential short-circuiting, without damaging an electrode of a normal battery. SOLUTION: The inspection method comprises determining failure of an electrode, if current made to flow in a circuit when applying voltage to the electrode is larger than the current made to flow when applying voltage to a normal electrode. The voltage to be applied to the electrode is an AC voltage having a voltage amplitude in a range where partial discharge does not occur in a normal electrode. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2004342476(A) |
申请公布日期 |
2004.12.02 |
申请号 |
JP20030138269 |
申请日期 |
2003.05.16 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
FUJIKAWA KAZUSATO;TSUTSUMI SHUJI;KUME TOSHIRO;SHIMADA MIKIYA |
分类号 |
H01M10/04;H01M10/48;(IPC1-7):H01M10/04 |
主分类号 |
H01M10/04 |
代理机构 |
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