发明名称 SUBSTRATE POLISHING APPARATUS
摘要 A substrate polishing apparatus (10) polishes a substrate (20) to a flat mirror finish. The substrate polishing apparatus (10) has a polishing table (12) against which a substrate (20) is pressed, a light-emitting and light-receiving device (24) to emit measurement light from the polishing table (12) to the substrate (20) and to receive reflected light from the substrate (20) for measuring a film on the substrate (20), a fluid supply passage (42) for supplying a measurement fluid, through which the measurement light and the reflected light pass, to a fluid chamber (68) provided at a light-emitting and light-receiving position of the polishing table (12), and a fluid supply control device (56, 58) for controlling supply of the measurement fluid to the fluid chamber (68).
申请公布号 WO2004103636(A2) 申请公布日期 2004.12.02
申请号 WO2004JP07152 申请日期 2004.05.19
申请人 EBARA CORPORATION;SHIMADZU CORPORATION;HIROKAWA, KAZUTO;KOBAYASHI, YOICHI;NAKAI, SHUNSUKE;OHTA, SHINROU;TSUKUDA, YASUO 发明人 HIROKAWA, KAZUTO;KOBAYASHI, YOICHI;NAKAI, SHUNSUKE;OHTA, SHINROU;TSUKUDA, YASUO
分类号 B24B37/04;B24B49/12;B24D7/12;H01L21/306 主分类号 B24B37/04
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