发明名称 Programmable memory devices with latching buffer circuit and methods for operating the same
摘要 Programmable memory devices include a memory cell having an associated bit line. A buffer circuit couples the bit line to a data line. The buffer circuit has a sense node coupled to the bit line and includes a latch circuit having a latch node coupled to the data line. A control circuit resets the latch node between a program operation of the memory cell and its corresponding program-verify operation. The memory devices may be NAND-type flash memory devices and the memory cell may be one of a string of memory cells connected in series between the bit line and a common source line. A transistor may couple the data line to the latch node and a transistor may couple the latch node to the sense node. Methods of operating the same are also provided.
申请公布号 US6826082(B2) 申请公布日期 2004.11.30
申请号 US20030403739 申请日期 2003.03.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG SANG-WON;LEE SUNG-SOO
分类号 G11C16/02;G11C7/06;G11C16/24;(IPC1-7):G11C16/04 主分类号 G11C16/02
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