发明名称 Method for forming dielectric thin film and dielectric thin film formed thereby
摘要 A method for forming a dielectric thin film includes a film deposition step of spraying a material solution onto a heated substrate under a reduced pressure by a two-fluid technique using an inert gas to deposit a thin film. The material solution is supplied at a rate that is greater than the vaporization rate of the solvent in the film deposited on the substrate. The supply of the material solution is stopped and the solvent remaining in the film is vaporized remaining solvent. Then, the film is heat-treated in an oxidizing atmosphere. The substrate is heated to a temperature in the range of about 100° C. to about 300° C. Thus, a dielectric thin film having reliability can be formed even if the film thickness is small.
申请公布号 US6825131(B2) 申请公布日期 2004.11.30
申请号 US20030339564 申请日期 2003.01.10
申请人 MURATA MANUFACTURING CO., LTD. 发明人 NISHIDA KOICHI;TAKESHIMA YUTAKA;SHIBUYA KOKI
分类号 C23C16/40;C23C4/12;C23C4/18;H01L21/314;H01L21/316;H01L21/8246;H01L27/105;(IPC1-7):H01L21/31;H01L21/469 主分类号 C23C16/40
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