发明名称 Testing substrate using eddy-current sensor arrays
摘要 An eddy current test circuit for measuring cracks, fatigue or stress in a specimen comprises a meandering primary winding having concentric circular substantially closed winding segments for imposing a spatially periodic magnetic field in the radial direction of at least two spatial wavelengths in a test substrate. At least one sensing element for sensing the response of the test substrate to the imposed magnetic field is included concentric with the winding segments.
申请公布号 GB2400445(B) 申请公布日期 2004.11.24
申请号 GB20040015070 申请日期 2000.09.20
申请人 * JENTEK SENSORS INCORPORATED 发明人 NEIL J * GOLDFINE;DARRELL E * SCHLICKER;ANDREW P * WASHABAUGH;VLADIMIR * ZILBERSTEIN;VLADIMIR * TSUKERNIK
分类号 G01L1/12;G01N27/90;(IPC1-7):G01N27/90;G01B7/06 主分类号 G01L1/12
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