发明名称 |
Testing substrate using eddy-current sensor arrays |
摘要 |
An eddy current test circuit for measuring cracks, fatigue or stress in a specimen comprises a meandering primary winding having concentric circular substantially closed winding segments for imposing a spatially periodic magnetic field in the radial direction of at least two spatial wavelengths in a test substrate. At least one sensing element for sensing the response of the test substrate to the imposed magnetic field is included concentric with the winding segments. |
申请公布号 |
GB2400445(B) |
申请公布日期 |
2004.11.24 |
申请号 |
GB20040015070 |
申请日期 |
2000.09.20 |
申请人 |
* JENTEK SENSORS INCORPORATED |
发明人 |
NEIL J * GOLDFINE;DARRELL E * SCHLICKER;ANDREW P * WASHABAUGH;VLADIMIR * ZILBERSTEIN;VLADIMIR * TSUKERNIK |
分类号 |
G01L1/12;G01N27/90;(IPC1-7):G01N27/90;G01B7/06 |
主分类号 |
G01L1/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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