发明名称 Determination of material parameters
摘要 A method for determining parameters of a material includes comparing a range of an actual x-ray scattering profile with a range of an expected x-ray scattering profile for a material sample. The expected profile is modified to match the actual profile and this is then repeated with an ever-larger range of the profiles until two profiles match across the whole of their profile. From the last modified expected profile the parameters of the material are determined.
申请公布号 US6823043(B2) 申请公布日期 2004.11.23
申请号 US20020179323 申请日期 2002.06.25
申请人 PANALYTICAL B.V. 发明人 FEWSTER PAUL F.;TYE GARETH A.
分类号 G01N23/20;(IPC1-7):G01N23/201 主分类号 G01N23/20
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