发明名称 |
Determination of material parameters |
摘要 |
A method for determining parameters of a material includes comparing a range of an actual x-ray scattering profile with a range of an expected x-ray scattering profile for a material sample. The expected profile is modified to match the actual profile and this is then repeated with an ever-larger range of the profiles until two profiles match across the whole of their profile. From the last modified expected profile the parameters of the material are determined.
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申请公布号 |
US6823043(B2) |
申请公布日期 |
2004.11.23 |
申请号 |
US20020179323 |
申请日期 |
2002.06.25 |
申请人 |
PANALYTICAL B.V. |
发明人 |
FEWSTER PAUL F.;TYE GARETH A. |
分类号 |
G01N23/20;(IPC1-7):G01N23/201 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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