发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device wherein a damascene structure achieving excellent via contact is built, and to provide a method for manufacturing the same. SOLUTION: In an electrode pattern 6 provided in a first interlayer insulating layer 3 formed on a semiconductor substrate 1, insulator-made dummy patterns 8 are provided, which are separated from each other by specified gaps and surround the bottom of a via contact hole 5a. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004327666(A) 申请公布日期 2004.11.18
申请号 JP20030119506 申请日期 2003.04.24
申请人 TOSHIBA CORP 发明人 NAGAMURA HIDEKI;OTSUKA MARI;MATSUNO TADASHI
分类号 H01L23/522;H01L21/768;H01L23/58;(IPC1-7):H01L21/768 主分类号 H01L23/522
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