发明名称 IMAGE SENSOR COMPRISING AN ADC TEST CIRCUIT CAPABLE OF MEASURING THE PERFORMANCE OF AN ANALOG DIGITAL CONVERTER(ADC)
摘要 PURPOSE: An image sensor comprising a test circuit of an ADC(Analog Digital Converter) is provided to remove an inconvenient process of directly radiating light on a pixel array by controlling the amount of light in various stages, thereby reducing a performance test time of an ADC. CONSTITUTION: A pixel array(201) generates an electric signal from an incident light. A CDS(Correlated Double Sampler)(202) outputs pure image information only by excluding noise components from the electric signal. A PGA(Programmable Gain Amplifier)(203) amplifies an output of the CDS(202) to output the amplified output. An ADC test signal supplier(204B) supplies an ADC test signal. The first selector(204A) transmits an output of the supplier(204B) or an output of the PGA(203). An ADC(205) inputs the output of the selector(204A), and converts into a digital signal. A test signal detector(204D) detects the output of the ADC(205). A DSP(206) finally outputs image information. The second selector(204C) transmits the output of the ADC(205) to the detector(204D) or the DSP(206).
申请公布号 KR20040095990(A) 申请公布日期 2004.11.16
申请号 KR20030027030 申请日期 2003.04.29
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 KIM, NAM RYEOL
分类号 H04N5/357;H04N5/372;(IPC1-7):H04N5/335 主分类号 H04N5/357
代理机构 代理人
主权项
地址