发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE TO RESTRAIN FLUCTUATION OF JUNCTION PROFILE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to reduce contact resistance and to restrain fluctuation of junction profile by forming a junction region using low dose. CONSTITUTION: A gate(3) is formed on a substrate(1) with an isolation layer(2). A spacer(4) is formed at both sidewalls of the gate. A junction region(5) is formed in the substrate by implanting dopants having low dose. An interlayer dielectric(6) is formed on the resultant structure. A contact hole(7) is formed to expose the junction region. Particles in the contact hole are removed by cleaning. A contact plug(8) is then formed by filling a phosphorous-doped silicon layer in the contact hole.
申请公布号 KR20040096341(A) 申请公布日期 2004.11.16
申请号 KR20030029320 申请日期 2003.05.09
申请人 HYNIX SEMICONDUCTOR INC. 发明人 AHN, TAE HWANG;LEE, SEOK GYU
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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