发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE TO RESTRAIN FLUCTUATION OF JUNCTION PROFILE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to reduce contact resistance and to restrain fluctuation of junction profile by forming a junction region using low dose. CONSTITUTION: A gate(3) is formed on a substrate(1) with an isolation layer(2). A spacer(4) is formed at both sidewalls of the gate. A junction region(5) is formed in the substrate by implanting dopants having low dose. An interlayer dielectric(6) is formed on the resultant structure. A contact hole(7) is formed to expose the junction region. Particles in the contact hole are removed by cleaning. A contact plug(8) is then formed by filling a phosphorous-doped silicon layer in the contact hole.
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申请公布号 |
KR20040096341(A) |
申请公布日期 |
2004.11.16 |
申请号 |
KR20030029320 |
申请日期 |
2003.05.09 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
AHN, TAE HWANG;LEE, SEOK GYU |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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