发明名称
摘要 A semiconductor device includes a first semiconductor layer formed above a first region of a supporting substrate with a buried oxide layer disposed therebetween and a second semiconductor layer formed on a second region of the supporting substrate. An interface between the supporting substrate and the second semiconductor layer is placed in substantially the same depth position as the undersurface of the buried oxide layer or in a position deeper than the buried oxide layer.
申请公布号 KR100457363(B1) 申请公布日期 2004.11.16
申请号 KR20020083927 申请日期 2002.12.26
申请人 发明人
分类号 H01L21/84;H01L21/76;H01L21/762;H01L21/8234;H01L21/8242;H01L27/08;H01L27/088;H01L27/10;H01L27/108;H01L27/12 主分类号 H01L21/84
代理机构 代理人
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