| 发明名称 |
Scanning IR microscope |
| 摘要 |
An FT-IR microscope is operated in association with a scanning spectrometer in such a way that incremental movement of the movable stage of 5 the microscope is synchronized with the scans of the scanning spectrometer. This minimizes delays in processing time.
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| 申请公布号 |
US2004222378(A1) |
申请公布日期 |
2004.11.11 |
| 申请号 |
US20040779959 |
申请日期 |
2004.02.17 |
| 申请人 |
CARTER RALPH LANCE;HOULT ROBERT ALAN |
发明人 |
CARTER RALPH LANCE;HOULT ROBERT ALAN |
| 分类号 |
G01J3/45;G01J3/06;G01J3/28;G01J3/453;G02B21/26;(IPC1-7):G01J5/02 |
主分类号 |
G01J3/45 |
| 代理机构 |
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代理人 |
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