发明名称 Verfahren zum Polieren von Werkstücken
摘要 There is disclosed a method of processing a work comprising polishing a work holding surface 4a of a work holding plate 4 by contacting and rubbing a work holding surface 4a of a work holding plate 4 with a polishing pad 2 attached on a polishing turn table 1 with providing polishing agent 5 thereto, holding a wafer W on said work holding surface 4a by vacuum-holding, and contacting and rubbing the wafer W with said polishing pad 2 to polish the work with providing polishing agent 5 characterized in that temperature of the polishing agent 5 or the polishing turn table 1 is controlled by temperature controller 7,9 so that a temperature of said work holding surface 4a when polishing said work holding plate 4 and a temperature of said work holding surface 4a when polishing the wafer w are controlled to be the same. Degradation of flatness due to thermal influence when polishing the holding plate and polishing the wafer can be prevented in a method of processing comprising polishing the work holding surface of the work holding plate to conform with the deformed shape of the polishing pad, holding a work with the work holding surface, and polishing the work. <IMAGE>
申请公布号 DE69914113(T2) 申请公布日期 2004.11.11
申请号 DE1999614113T 申请日期 1999.02.02
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 MASUMURA, HISASHI;SUZUKI, FUMIO;OKAMURA, KOUICHI
分类号 B24B37/00;B24B37/015;B24B37/04;B24B49/14;H01L21/304;(IPC1-7):B24B37/04 主分类号 B24B37/00
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