| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a photoelectric field measuring device and photoelectric field measuring method capable of measuring with high sensitivity, the electric field in a measuring cavity where a high voltage is impressed. <P>SOLUTION: The photoelectric field measuring device 1 generates an incidence light for introducing in an optical waveguide arranged in a measuring cavity, and based on the interference light between reflection lights which are reflected from a first branch incidence light and a second branch incidence light branched from the incidence light, the electric field generated in the measuring cavity is measured. The device comprises a semiconductor laser LD3, LiNbO<SB>3</SB>crystal substrate 11, PIN (p-i-n) photodiode PD5, electric field measuring circuit 7 and an optical coupler 9. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
