| 摘要 |
PURPOSE: A method for manufacturing a Cu alloy sample for an emission spectrometer is provided to minimize an analyzation error by formulating a sampling and pre-treating method, and analyzation equipment according to an analyzation material. CONSTITUTION: A method for manufacturing a Cu alloy sample for an emission spectrometer includes a step of sampling a sample, which is cut by using a cutting machine. The sample is cleaned by using ultrasonic cleaning equipment. The cleaned sample is dried by using a dry oven. A surface of the dried sample is processed by using a belt grinder. A sectional area of the sample is about 20mm. The sample is cut by using a zirconium cutting device under a condition of a rotating speed of 2,500¯3,000rpm and a sliding speed of 1¯1.5 mm/min.
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