发明名称 PROCESS METER
摘要 The process meter serves for the measurement of a physical process parameter of a medium contained in a process vessel or flowing in a process line and comprises a meter probe (10), with a sensor arrangement (60), providing measured signals (s1, s2) and a meter electronics device (50), connected to the meter probe (10). The sensor arrangement (60) comprises a primary sensor element (17), reacting to the physical process parameter, also in particular, changes in the physical process parameter and provides a measured signal (s1), dependent on the physical process parameter. The sensor arrangement (60) further comprises at least one temperature sensor (40), arranged in the meter probe (10), which records a local temperature (T1) in the meter probe (10) and provides the sensor arrangement (60) with a measured temperature signal (theta1) which represents the temperature (T1) in the meter probe (10). The meter electronics device (50) generates an instantaneous measured value (X), representing the physical parameter, using the measured signal (s1) and using a correction value (K1) for the measured signal (s1). The meter electronics device (50) determines said correction value (K1), by means of the curve with time of the one measured temperature signal (theta1), such as to take account of the temperature values recorded by the temperature sensor (40) in the past. According to the invention, temperature generated errors in the measured signal are well compensated by said process meter, even with a fluctuating transition range for the temperature distribution within the meter probe and particularly with the application of only a few temperature sensors.
申请公布号 WO2004053428(A3) 申请公布日期 2004.10.28
申请号 WO2003EP13543 申请日期 2003.12.02
申请人 ENDRESS + HAUSER FLOWTEC AG 发明人 DRAHM, WOLFGANG;RIEDER, ALFRED
分类号 G01D;G01D3/028;G01D3/036;G01D21/00;G01F1/84;G01F15/02;G01N9/00;G01N11/00;G12B7/00 主分类号 G01D
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