| 摘要 |
The present invention refers to an electronic apparatus, preferably a microchip testing device, comprising at least one circuit board mounted on a cooling device. This circuit board supports at least one microchip. The circuit board supports the microchip on a side turned to the cooling device, wherein the cooling device is adapted for providing a cooling of a side of the microchip, which side is turned to the cooling device. A thermal conductor is arranged between the microchip and the cooling device for providing a thermal contact between the cooling device and the one side of the microchip turned to the cooling device. The thermal conductor comprises at least one of a group comprising: a thermally conductive knead, a plasticine, a kneadable and thermally conductive material, and a plastically deformable and thermally conductive material.
|
